How much sensitivity must be provided by KED and DRC modes when sampler background contamination is annoying?
Type de document
Communications orales
Date de la conférence
2019-01-01
Langue
Anglais
Nom de la conférence
Conference on Measurement of Trace Metals and Metalloids at Workplace
Lieu de la conférence
Houston, TX
Mots-clés
Échantillonnage et analyse, Sampling and analysis
Numéro de projet IRSST
n/a
Citation recommandée
Gagné, S., Rams, A., Pineault, S. et Calosso, M. (2019). How much sensitivity must be provided by KED and DRC modes when sampler background contamination is annoying? [Communication]. Conference on Measurement of Trace Metals and Metalloids at Workplace, Houston, TX.
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